Abstract
Low-cost multi-zone single-photon avalanche diode (SPAD) sensors provide compact time-of-flight measurements but are limited by sparse sampling and unreliable depth estimates near geometric discontinuities. This letter presents a reliability-aware reconstruction framework for V-shaped surfaces using two complementary TMF8821 acquisition configurations. Point-wise reliability is learned from sensor confidence, transient peak amplitude, and peak sharpness, and is incorporated into a graph-based depth optimization. The reconstructed geometry is evaluated by robust two-plane fitting and a perpendicular cross-section. Experiments on 60-degree, 90-degree, and 120-degree targets reduce the mean V-angle error from 11.21 degrees to 9.66 degrees (13.8%). For the representative 90-degree target, the combined point-to-plane RMSE decreases from 14.56 mm to 13.65 mm.
Abstract (translated)
URL
https://arxiv.org/abs/2610.28258
