Abstract
To address data overload and inefficient shape-level annotation in robotic visual inspection, this paper proposes a hardware-software integrated optoelectronic architecture. A non-imaging, low-data paradigm is established to minimize annotation dependency. First, a sensor-in-the-loop strategy reconfigures a Digital Micromirror Device (DMD) as a physical optical convolutional layer, enabling photonic-domain feature extraction that unifies sensing hardware and processing software. To suppress data volume at the source, a block-based compressed sensing strategy encodes spatial information into low-dimensional temporal signals, drastically reducing redundancy. Subsequently, to bypass laborious manual defect shape annotation, natural language descriptions guide the network to align with highly generalizable features from Contrastive Language-Image Pre-training (CLIP), steering the attention maps of the optoelectronic neural network toward defect shapes. Furthermore, a Localization Accuracy for Attention (LAA) metric is proposed to quantify shape-level defect localization performance. Experiments on transparent material defect detection validate the system's effectiveness. Parametric analysis reveals how measurement matrices, compression ratios, and block sizes affect accuracy. Results show that, compared to traditional imaging, the proposed architecture maintains equivalent accuracy while reducing data volume by 90% for Vision Transformers and computational workload by 60% for Convolutional Neural Networks. This low-data paradigm offers an efficient solution for industrial automation scenarios involving massive data streams, high acquisition costs, or constrained edge resources.
Abstract (translated)
URL
https://arxiv.org/abs/2606.25277
